Home Browse by Subject Bestsellers New Titles Editor's Choice New Reviews Textbooks
Search Book Series Study Guides Rights Inspection Copy Contact Us Join Our Mailing List
For Authors How to Order E-Catalogues

Browse all Subjects
Search Bookshop
New Titles
Editor's Choice
Bestsellers
Book Series
Textbooks
Journals
Join Our Mailing List
 
NOISE IN PHYSICAL SYSTEMS AND 1/f FLUCTUATIONS
ICNF 2001
Proceedings of the 16th International Conference

Gainesville, Florida, USA 22 - 25 October 2001

edited by Gijs Bosman (University of Florida, USA)

The International Conference on Noise in Physical Systems and 1/f Fluctuations brings together physicists and engineers interested in all aspects of noise and fluctuations in materials, devices, circuits, and physical and biological systems. The experimental research on novel devices and systems and the theoretical studies included in this volume provide the reader with a comprehensive, in-depth treatment of present noise research activities worldwide.


Contents:

  • Noise in Nanoscale Devices (S Bandyopadhyay et al.)
  • 1/f Voltage Noise Induced by Magnetic Flux Flow in Granular Superconductors (O V Gerashchenko)
  • Low Frequency Noise Analysis of Different Types of Polysilicon Resistors (A Penarier et al.)
  • Low Frequency Noise in CMOS Transistors: An Experimental and Comparative Study on Different Technologies (P Fantini et al.)
  • Modeling of Current Transport and 1/f Noise in GaN Based HBTs (H Unlu)
  • Low Frequency Noise in CdSe Thin Film Transistors (M J Deen & S Rumyanstsev)
  • NIST Program on Relative Intensity Noise Standards for Optical Fiber Sources Near 1550 nm (G Obarski)
  • Physical Model of the Current Noise Spectral Density Versus Dark Current in CdTe Detectors (A Imad et al.)
  • Time and Frequency Study of RTS in Bipolar Transistors (A Penarier et al.)
  • Neural Network Based Adaptive Processing of Electrogastrogram (S Selvan)
  • Shot Noise as a Test of Entanglement and Nonlocality of Electrons in Mesoscopic Systems (E V Sukhorukov et al.)
  • The Readout of Time, Continued Fractions and 1/f Noise (M Planat & J Cresson)
  • Longitudinal and Transverse Noise of Hot Electrons in 2DEG Channels (J Liberis et al.)
  • 1/f Noise, Intermittency and Clustering Poisson Process (F Gruneis)
  • Noise Modeling for PDE Based Device Simulations (F Bonani & G Ghione)
  • Methods of Slope Estimation of Noise Power Spectral Density (J Smulko)
  • and other papers


Readership: Researchers, academics and graduate students in electrical and electronic engineering, biophysics, nanoscience, applied physics, statistical physics and semiconductor science.

848pp Pub. date: Aug 2001
ISBN 978-981-02-4677-8
981-02-4677-3
US$154 / £114


Copyright © 2008 World Scientific Publishing Co. All rights reserved.
Updated on 5 September 2008